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1998

Bartsch, M.

Proceedings of the 11th Europ. Congress on Electron Microscopy (Electron Microscopy 96) 2, pp 752-753 (Ed.) #Committee of European Societies of Microscopy,European Societies of Microscopy, Brussels, Belgium (1998)


Baufeld, B., Baither, D., Bartsch, M., Messerschmidt, U.

Physica Status Solidi A 166, (1),pp 127-153 (1998)

Referenz:ki-1998-p05

Baufeld, B., Petukhov, B. V., Bartsch, M., Messerschmidt, U.

Acta Materialia 46, (9),pp 3077-3085 (1998)

Referenz:ki-1998-t05

Berakdar, J.

Physical Review A 58, (3),pp R1641-R1644 (1998)

Referenz:ki-1998-p06

Berakdar, J.

Physical Review B 58, (15),pp 9808-9816 (1998)

Referenz:ki-1998-e04

Berakdar, J.

Journal of Physics B 31, pp 3167 (1998)

Referenz:ki-1998-d04

Berakdar, J., Dorn, A., Elliott, A., Weigold, E., Lower, J.

Journal of Electron Spectroscopy and Related Phenomena 88-91, pp 59-64 (1998)

Referenz:ki-1998-d01

Berakdar, J., Samarin, S. N., Herrmann, R., Kirschner, J.

Physical Review Letters 81, pp 3535-3538 (1998)

Referenz:TH-1998-06

Bert, N. A., Suvorova, A. A., Chaldyshev, V. V., Musikhin, Y. G., Preobrazhenskii, V. V., Putyato, M. A., Semyagin, B. R., Werner, P.

Semiconductors 32, pp 683-688 (1998)


Bohley, C., Martini, T., Bischoff, G., Lindau, S., Birchhirschfeld, E., Kargov, S. I., Meister, W. V., Barthel, J., Hoffmann, S.

Nucleosides Nucleotides 16, pp 2013-2018 (1998)

Referenz:ki-1998-s02

Camarero, J., de Miguel, J. J., Graf, T., Miranda, R., Kuch, W., Zharnikov, M., Dittschar, A., Schneider, C. M., Kirschner, J.

Surface Science 402-404, pp 346-350 (1998)

Referenz:ki-1998-t01

Dewitz, J. P., Chen, J., Hübner, W.

Physical Review B 58, pp 5093-5105 (1998)

Referenz:ki-1998-n01

Dittschar, A., Zharnikov, M., Kuch, W., Lin, M.-T., Schneider, C. M., Kirschner, J.

Physical Review B 57, (6),pp R3209-R3212 (1998)

Referenz:ki-1998-c03

Dorn, A., Elliott, A., Lower, J., Weigold, E., Berakdar, J., Engelns, A., Klar, H.

Physical Review Letters 80, (2),pp 257-260 (1998)

Referenz:ki-1998-o01

Dubiel, M., Brunsch, S. and Mohr, Ch., Hofmeister, H.

Proceedings of the 18th International Congress on Glasspp 119-124 (Eds.) Choudhary, M. K., Huff, N. T. and Drummond III, C. H.,The American Ceramic Society, on CD-ROM, Westerville, USA (1998)


Elmers, H.-J., Hauschild, J., Gradmann, U.

Applied Physics Letters 72, (24),pp 3211-3213 (1998)

Referenz:ki-1998-p02

Elmers, H.-J., Hauschild, J., Gradmann, U.

Journal of Magnetism and Magnetic Materials 177-181, (2),pp 827-828 (1998)

Referenz:ki-1998-m05

Feder, R., Gollisch, H., Meinert, D., Scheunemann, T., Artamonov, O. M., Samarin, S. N., Kirschner, J.

Physical Review B 58, (24),pp 16418-16431 (1998)

Referenz:ki-1998-l01

Gao, X. Y, Salvietti, M., Kuch, W., Schneider, C. M., Kirschner, J.

Physical Review B 58, (23),pp 15426-15429 (1998)


Hauschild, J., Elmers, H.-J., Gradmann, U.

Physical Review B 57, (2),pp R677-R680 (1998)

Referenz:ki-1998-d02

Herrmann, R., Samarin, S. N., Schwabe, H., Kirschner, J.

Physical Review Letters 81, (10),pp 2148-2151 (1998)

Referenz:ki-1998-t06

Hofmann, D., Schindler, W., Kirschner, J.

Applied Physics Letters 73, (22),pp 3279-3281 (1998)

Referenz:ki-1998-e02

Hübner, W.

Nonlinear Optics in Metalspp 268-436 (Ed.) Bennemann, K. H.,Clarendon Press, Oxford, UK (1998)


Hübner, W.

Nonlinear Optics in Metals, International Series of Monographs on Physics 98, pp 268-436 (Ed.) Bennemann, K. H.,Clarendon Press, New York, USA 1998


Hübner, W., Zhang, G. P.

Physical Review B 58, (10),pp R5920-R5923 (1998)

Referenz:ki-1998-u01

Hübner, W., Zhang, G. P.

Journal of Magnetism and Magnetic Materials 189, (1),pp 101-105 (1998)

Referenz:ki-1998-f02

Jin, Q.-Y., Regensburger, H., Vollmer, R., Kirschner, J.

Physical Review Letters 80, (18),pp 4056-4059 (1998)

Referenz:ki-1998-p01

Klaua, M., Shen, J., Ohresser, P., Jenniches, H., Barthel, J., Mohan, C.-V., Kirschner, J.

IEEE Transactions on Magnetics 34, pp 1216 (1998)

Referenz:ki-1998-c01

Koop, T., Schindler, W., Kazimirov, A., Scherb, G., Zegenhagen, J., Schulz, Th., Feidenhans'l, R., Kirschner, J.

Review of Scientific Instruments 69, (4),pp 1840-1843 (1998)

Referenz:ki-1998-e01

Kuch, W., Dittschar, A., Salvietti, M., Lin, M.-T., Zharnikov, M., Schneider, C. M., Camarero, J., de Miguel, J. J., Miranda, R., Kirschner, J.

Physical Review B 57, (9),pp 5340-5346 (1998)

Referenz:ki-1998-m01

Kuch, W., Frömter, R., Gilles, J., Hartmann, D., Ziethen, Ch., Schneider, C. M., Schönhense, G., Swiech, W., Kirschner, J.

Surface Review and Letters 5, (6),pp 1241-1248 (1998)

Referenz:ki-1998-e03

Kuch, W., Marley, A. C., Parkin, S. S. P.

Journal of Applied Physics 83, (9),pp 4709-4713 (1998)

Referenz:ki-1998-s01

Kuch, W., Parkin, S. S. P.

Journal of Magnetism and Magnetic Materials 184, (2),pp 127-136 (1998)

Referenz:ki-1998-s08

Kuch, W., Salvietti, M., Gao, X. Y, Klaua, M., Barthel, J., Mohan, C.-V., Kirschner, J.

Journal of Applied Physics 83, (11),pp 7019-7021 (1998)

Referenz:ki-1998-a04

Kuch, W., Salvietti, M., Gao, X. Y, Lin, M.-T., Klaua, M., Barthel, J., Mohan, C.-V., Kirschner, J.

Physical Review B 58, (13),pp 8556-8565 (1998)

Referenz:ki-1998-a05

Lin, M.-T., Shen, J., Kuch, W., Jenniches, H., Klaua, M., Schneider, C. M., Kirschner, J.

Surface Science 410, (2-3),pp 290-311 (1998)

Referenz:ki-1998-g02

Malzbender, J., Przybylski, M., Giergiel, J., Kirschner, J.

Surface Science 414, pp 187-196 (1998)

Referenz:ki-1998-e05

Manoharan, S. S., Goodenough, J. B., Elefant, D., Reiss, G.

Applied Physics Letters 72, (8),pp 984-986 (1998)

Referenz:ki-1998-e07

Manoharan, S. S., Klaua, M., Shen, J., Barthel, J., Jenniches, H., Kirschner, J.

Physical Review B 58, (13),pp 8549-8555 (1998)

Referenz:ki-1998-a06

Messerschmidt, U.

Physical Properties of Quasicrystals, Springer Series in Solid-State Sciences 126, pp 361-401 (Ed.) Stadnik, Z. M.,Springer-Verlag, Berlin, Germany 1998


Messerschmidt, U.

Physical Properties of Quasicrystals, Springer Series in Solid-State Sciences 126, pp 361-401 (Ed.) Stadnik, Z. M.,Springer-Verlag, (1998)

Referenz:ki-1998-m09

Messerschmidt, U., Baither, D., Bartsch, M. and Baufeld, B., Häußler, D., Sauthoff, G.

Proceedings of the 4th Special Symposium on Advanced Materialspp 349-352 (Eds.) Imura, T., Fujita, H., Ichinokawa, T. and Kawazoe, H.,Nagoya University, Nagoya, Japan (1998)


Messerschmidt, U., Baither, D., Bartsch, M., Baufeld, B., Geyer, B., Guder, S., Wasilkowska, A., Czyrska-Filemonowicz, A., Yamaguchi, M., Feuerbacher, M., Urban, K.

Microscopy and Microanalysis 3, pp 226-234 (1998)

Referenz:ki-1998-h02

Messerschmidt, U., Bartsch, M., Guder, S., Häußler, D., Haushälter, R., Yamaguchi, M.

Intermetallics 6, pp 729-733 (1998)

Referenz:ki-1998-d03

Messerschmidt, U., Baufeld, B., Baither, D.

Key Engineering Materials 153-154, pp 143-182 (1998)

Referenz:ki-1998-p04

Millev, Y. T., Cullen, J. R., Oepen, H.-P.

Journal of Applied Physics 83, (11),pp 6500-6502 (1998)

Referenz:ki-1998-t03

Millev, Y. T., Oepen, H.-P., Kirschner, J.

IEEE Transactions on Magnetics 34, pp 1210-1212 (1998)

Referenz:ki-1998-s04

Millev, Y. T., Oepen, H.-P., Kirschner, J.

Physical Review B 57, (10),pp 5837-5847 (1998)

Referenz:ki-1998-i02

Millev, Y. T., Oepen, H.-P., Kirschner, J.

Physical Review B 57, (10),pp 5848-5859 (1998)

Referenz:ki-1998-i03

Millev, Y. T., Skomski, R., Kirschner, J.

Physical Review B 58, (10),pp 6305-6315 (1998)

Referenz:ki-1998-h01

Mohan, C.-V., Kronmüller, H.

Journal of Magnetism and Magnetic Materials 182, (3),pp 287-296 (1998)

Referenz:ki-1998-c05

Mohan, C.-V., Kronmüller, H.

Journal of Alloys and Compounds 267, pp L9 - L11 (1998)

Referenz:ki-1998-a02

Mohan, C.-V., Kronmüller, H., Kelsch, M.

Physical Review B 57, (5),pp 2701-2704 (1998)

Referenz:ki-1998-m03

Mohan, C.-V., Seeger, M., Kronmüller, H., Murugaraj, P., Maier, J.

Journal of Magnetism and Magnetic Materials 183, (3),pp 348-355 (1998)

Referenz:ki-1998-c04

Plößl, A., Scholz, R. and Bagdahn, J., Stenzel, H., Tu, K. N., Gösele, U.

Proceedings of the 8th International Symposium on Silicon Materials Science and Technology 2, pp 1361-1372 (Eds.) Huff, H. R., Tsuya, H. and Gösele, U.,The Electrochem. Soc. Inc., Pennington, USA (1998)


Reuter, D., Gerth, G., Kirschner, J.

Physical Review B 57, (4),pp 2520-2529 (1998)

Referenz:ki-1998-a01

Rosenfeld, G., Morgenstern, K., Beckmann, I., Wulfhekel, W., Lægsgaard, E., Besenbacher, F., Comsa, G.

Surface Science 402-404, pp 401-408 (1998)

Referenz:ki-1998-s05

Rosenfeld, G., Wulfhekel, W., Beckmann, I., Comsa, G., Poelsema, B.

Surface Science 395, (2-3),pp 168-181 (1998)

Referenz:ki-1998-g01

Samarin, S. N., Herrmann, R., Schwabe, H., Artamonov, O. M.

Journal of Electron Spectroscopy and Related Phenomena 96, (1-3),pp 61-67 (1998)


Samarin, S. N., Herrmann, R., Schwabe, H., Artamonov, O. M.

Journal of Electron Spectroscopy and Related Phenomena 96, (1-3),pp 61-67 (1998)

Referenz:ki-1998-a03

Sander, D., Enders, A., Kirschner, J.

IEEE Transactions on Magnetics 34, pp 2015-2017 (1998)

Referenz:ki-1998-m06

Sander, D., Enders, A., Schmidthals, C., Reuter, D., Kirschner, J.

Journal of Magnetism and Magnetic Materials 177-181, (2),pp 1300 (1998)

Referenz:ki-1998-s06

Sander, D., Enders, A., Schmidthals, C., Reuter, D., Kirschner, J.

Surface Science 402-404, pp 351-355 (1998)

Referenz:ki-1998-m10

Sander, D., Schmidthals, C., Enders, A., Kirschner, J.

Physical Review B 57, (3),pp 1406-1409 (1998)

Referenz:ki-1998-s07

Sander, D., Skomski, R., Enders, A., Schmidthals, C., Reuter, D., Kirschner, J.

Journal of Physics D 31, pp 663-670 (1998)

Referenz:ki-1998-t02

Schindler, W., Koop, T., Hofmann, D., Kirschner, J.

IEEE Transactions on Magnetics 34, pp 963-967 (1998)

Referenz:ki-1998-r01

Schmidthals, C., Enders, A., Sander, D., Kirschner, J.

Surface Science 402-404, pp 636-640 (1998)

Referenz:ki-1998-c02

Schmidthals, C., Sander, D., Enders, A., Kirschner, J.

Surface Science 417, (2-3),pp 361-371 (1998)

Referenz:ki-1998-s10

Schneider, O., Schwitzgebel, G.

Synthetic Metals 93, (3),pp 219-225 (1998)

Referenz:ki-1998-t04

Shen, J., Jenniches, H., Mohan, C.-V., Barthel, J., Klaua, M., Ohresser, P., Kirschner, J.

Europhysics Letters 43, (3),pp 349-354 (1998)

Referenz:ki-1998-i04

Shen, J., Mohan, C.-V., Ohresser, P., Klaua, M., Kirschner, J.

Physical Review B 57, (21),pp 13674-13680 (1998)

Referenz:ki-1998-e06

Shen, J., Ohresser, P., Mohan, C.-V., Klaua, M., Barthel, J., Kirschner, J.

Physical Review Letters 80, (9),pp 1980-1983 (1998)

Referenz:ki-1998-m02

Shen, J., Schmidthals, C., Woltersdorf, J., Kirschner, J.

Surface Science 407, pp 96-103 (1998)

Referenz:ki-1998-s09

Skomski, R.

Journal of Applied Physics 83, (11),pp 6503-6505 (1998)

Referenz:ki-1998-m11

Skomski, R.

IEEE Transactions on Magnetics 34, pp 1207-1209 (1998)

Referenz:ki-1998-m07

Skomski, R., Oepen, H.-P., Kirschner, J.

Physical Review B 58, (17),pp 11138-11141 (1998)

Referenz:ki-1998-u02

Skomski, R., Oepen, H.-P., Kirschner, J.

Physical Review B 58, (6),pp 3223-3227 (1998)

Referenz:ki-1998-m12

Skomski, R., Sander, D., Schmidthals, C., Enders, A., Kirschner, J.

IEEE Transactions on Magnetics 34, pp 852-854 (1998)

Referenz:ki-1998-i06

Skomski, R., Wirth, S.

Journal of Applied Physics 83, (11 Part 2),pp 6896-6898 (1998)


Skomski, R., Wirth, S.

Journal of Applied Physics 83, (11),pp 6896-6898 (1998)

Referenz:ki-1998-i01

Swiech, W. and Frömter, R., Schneider, C. M., Kuch, W., Ziethen, Ch., Schmidt, O. G., Fecher, G. H., Schönhense, G., Kirschner, J.

Proceedings of the 14th International Congress of Electron Microscopy (Electron Microscopy 1998) II, pp 511-512 (Eds.) Calderón Benavides, H. A. and Yacamán, M. J.,Inst. Of Physics Publ., Bristol and Philadelphia (1998)


Teichert, Ch., Bean, J. C., Lagally, M. G.

Applied Physics A 67, (6),pp 675-685 (1998)

Referenz:ki-1998-s03

Vollmer, R.

Nonlinear Optics in Metalspp 42-131 (Ed.) Bennemann, K. H.,Clarendon Press, Oxford, UK (1998)


Wasilkowska, A., Bartsch, M., Messerschmidt, U., Czyrska-Filemonowicz, A.

Inzynieria Materialowa 3, pp 463-466 (1998)

Referenz:ki-1998-i05

Wollgarten, M.

Proceedings of the 11th Europ. Congress on Electron Microscopy (Electron Microscopy 96) 2, pp 269-270 (Ed.) #Committee of European Societies of Microscopy,European Societies of Microscopy, Brussels, Belgium (1998)


Wollgarten, M. and Takeuchi, S., Messerschmidt, U., Bartsch, M.

Proceedings of the 6th International Congress on Quasicrystalspp 549-552 (Eds.) Takeuchi, S. and Fujiwara, T.,World Scientific, Singapore, Singapore (1998)


Zheng, M., Wu, X. C., Zou, B. S., Wang, Y. J.

Journal of Magnetism and Magnetic Materials 183, (1-2),pp 152-156 (1998)

Referenz:ki-1998-m04

Ziethen, Ch.

Proceedings of the International Symposium on Atomic Level Characterizations for New Materials and Devicespp 367-371 (Ed.) #Microbeam Analysis,Committee of Japan Soc. for the Promotion of Science, Tokyo, Japan (1998)


Ziethen, Ch., Schmidt, O., Fecher, G. H., Schneider, C. M., Schönhense, G., Frömter, R., Seider, M., Grzelakowski, K., Merkel, M., Funnemann, D., Swiech, W., Gundlach, H., Kirschner, J.

Journal of Electron Spectroscopy and Related Phenomena 88-91, pp 983-989 (1998)

Referenz:ki-1998-f01