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2000

Dietzsch, Chr., Bartsch, M., Häußler, D., Messerschmidt, U., Feuerbacher, M., Urban, K.

Proceedings of the 12th European Congress on Electron Microscopy II, pp P545-546 Czechoslovak Society for Electron Microscopy, Brno, Czech Republic (2000)


van Dijken, S., Vollmer, R., Poelsema, B., Kirschner, J.

Journal of Magnetism and Magnetic Materials 210, (1-3),pp 316-328 (2000)

Referenz:ki-2000-t02

Ding, H. F., Pütter, S., Oepen, H.-P., Kirschner, J.

Journal of Magnetism and Magnetic Materials 212, (1-2),pp L5-L11 (2000)

Referenz:ki-2000-e03

Dittschar, A., Kuch, W., Zharnikov, M., Schneider, C. M.

Journal of Magnetism and Magnetic Materials 212, (3),pp 307-322 (2000)

Referenz:ki-2000-i04

Edelmann, F., Hahn, H., Seifried, S., Alof, C., Höche, H., Balogh, A., Werner, P., Zakrzewska, K., Radecka, M., Pasierb, P., Chack, A., Mikhelashvili, V., Eisenstein, G.

Materials Science & Engineering B 69/70, (Special Is),pp 386-391 (2000)


Fruchart, O., Klaua, M., Barthel, J., Kirschner, J.

Applied Surface Science 162, pp 529-536 (2000)

Referenz:ki-2000-g02

Geyer, B., Bartsch, M., Feuerbacher, M., Urban, K., Messerschmidt, U.

Philosophical Magazine A 80, pp 1151-1163 (2000)

Referenz:ki-2000-p01

Gutjahr-Löser, Th., Sander, D., Kirschner, J.

Journal of Applied Physics 87, (9 Part 3),pp 5920-5922 (2000)

Referenz:ki-2000-m07

Gutjahr-Löser, Th., Sander, D., Kirschner, J.

Journal of Magnetism and Magnetic Materials 220, (1),pp L1-L7 (2000)

Referenz:ki-2000-m06

Häußler, D., Reppich, B., Bartsch, M., Messerschmidt, U.

Materials Science & Engineering A 309-310, pp 500-504 (2000)


Imada, S., Suga, S., Kuch, W., Kirschner, J.

Journal of the Japanese Society for Synchrotron Radiation Research 13, (4),pp 283-291 (2000)

Referenz:ki-2000-m03

Imada, S., Ueda, S., Jung, R. J., Saitoh, Y., Kotsugi, M., Kuch, W., Gilles, J., Kang, S.-S., Offi, F., Kirschner, J., Daimon, H., Kimura, T., Yanagisawa, J., Gamoh, K., Suga, S.

Japanese Journal of Applied Physics 39, (6B),pp L585-L587 (2000)

Referenz:ki-2000-m08

Kuch, W., Gilles, J., Kang, S.-S., Imada, S., Suga, S., Kirschner, J.

Physical Review B 62, (6),pp 3824-3833 (2000)

Referenz:ki-2000-m01

Kuch, W., Gilles, J., Kang, S.-S., Offi, F., Kirschner, J., Imada, S., Suga, S.

Journal of Applied Physics 87, (9 Part 2),pp 5747-5749 (2000)

Referenz:ki-2000-q01

Kuch, W., Gilles, J., Offi, F., Kang, S.-S., Imada, S., Suga, S., Kirschner, J.

Journal of Electron Spectroscopy and Related Phenomena 109, pp 249-265 (2000)

Referenz:ki-2000-i01

Levanov, N. A., Stepanyuk, V. S., Hergert, W., Bazhanov, D. I., Dederichs, P. H., Katsnelson, A. A., Katsnelson, A. A., Massobrio, C.

Physical Review B 61, (3),pp 2230-2234 (2000)

Referenz:ki-2000-e02

Lévy, J. C. S., Lévy, J. C. S., Ghazali, A., Vedmedenko, E. Y.

Acta Physica Polonica A 97, (3),pp 431-434 (2000)

Referenz:ki-2000-m04

Marcus, P. M., Qian, X. H., Hübner, W.

Journal of Physics C 12, (26),pp 5541-5550 (2000)

Referenz:ki-2000-s03

Messerschmidt, U.

Mitteilungen der Deutschen Gesellschaft für Elektronenmikroskopie 19, pp 16-18 (2000)


Messerschmidt, U., Bartsch, M.

Proceedings of the 12th European Congress on Electron Microscopy II, pp P517-520 Czechoslovak Society for Electron Microscopy, Brno, Czech Republic (2000)


Messerschmidt, U., Bartsch, M., Geyer, B., Feuerbacher, M., Urban, K.

Philosophical Magazine A 80, pp 1165-1181 (2000)

Referenz:ki-2000-p02

Messerschmidt, U., Guder, S., Häußler, D., Bartsch, M.

International Conference on Processing and Manufacturing of Advanced Materials, THERMEC 2000 CD-Rom, Journal of Materials Proc. Technol., Las Vegas, USA (2000)


Messerschmidt, U., Guder, S., Junker, L., Bartsch, M., Yamaguchi, M.

Materials Science & Engineering A 319-321, pp 342-346 (2000)


Messerschmidt, U., Petukhov, B. V., Bartsch, M., Dietzsch, Chr., Geyer, B., Häußler, D., Ledig, L., Feuerbacher, M., Schall, P., Urban, K.

Materials Science & Engineering A 319-321, pp 107-110 (2000)


Monchesky, T., Urban, R., Heinrich, B., Klaua, M., Kirschner, J.

Journal of Applied Physics 87, (9 Part 2),pp 5167-5169 (2000)

Referenz:ki-2000-g01

Nielsch, K., Müller, F., Liu, G., Wehrspohn, R. B., Gösele, U. and Fischer, S. F., Kronmüller, H.

Electrochemical Society Proceedingspp 13 (Eds.) Andricacos, P. C., Searson, P. C., Reidsema-Simpson, C., Allongue, P., Stickney, J.L. and Oleszek, G. M.,Pennington, USA (2000)


Oepen, H.-P., Millev, Y. T., Ding, H. F., Pütter, S., Kirschner, J.

Physical Review B 61, (14),pp 9506-9512 (2000)

Referenz:TH-2000-15

Petukhov, B. V., Bartsch, M., Messerschmidt, U.

European Physical Journal Applied Physics 9, (2),pp 89-95 (2000)

Referenz:ki-2000-t01

Qian, X. H., Wagner, F., Petersen, M., Hübner, W.

Journal of Magnetism and Magnetic Materials 213, (1-2),pp 43435 (2000)

Referenz:ki-2000-a01

Regensburger, J., Vollmer, R., Kirschner, J.

Physical Review B 61, (21),pp 14716-14722 (2000)

Referenz:ki-2000-t03

Samarin, S. N., Berakdar, J., Artamonov, O. M., Kirschner, J.

Physical Review Letters 85, pp 1746-1749 (2000)

Referenz:TH-2000-07

Samarin, S. N., Berakdar, J., Artamonov, O. M., Schwabe, H., Kirschner, J.

Surface Science 470, (1-2),pp 141-148 (2000)

Referenz:TH-2000-14

Schindler, W., Hofmann, D., Kirschner, J.

Journal of Applied Physics 87, (9 Part 3),pp 7007-7009 (2000)

Referenz:ki-2000-n02

Schindler, W., Koop, T., Kazimirov, A., Scherb, G., Zegenhagen, J., Schultz, Th., Feidenhans'l, R., Kirschner, J.

Surface Science 465, (3),pp L783-L788 (2000)

Referenz:ki-2000-n03

Schneider, C. M. and Kirschner, J.

Handbook of Surface Science 2, pp 511-668 (Eds.) Horn, K. and Scheffler, M.,Elsevier Science, 2000

Referenz:ki-2000-m05

Steierl, G., Lutzke, W., Oepen, H.-P., Kirschner, J.

Magnetoelektronik, Beiträge zum BMBF-Statusseminar Magnetoelektronikpp 341-343 Düsseldorf, Germany (2000)


Stepanyuk, V. S., Bazhanov, D. I., Baranov, A. N., Hergert, W., Dederichs, P. H., Kirschner, J.

Physical Review B 62, (23),pp 15398-15401 (2000)

Referenz:ki-2000-s01

Stepanyuk, V. S., Bazhanov, D. I., Hergert, W.

Physical Review B 62, (7),pp 4257-4260 (2000)

Referenz:ki-2000-e01

Trzeciecki, M., Hübner, W.

Physical Review B 62, (21),pp 13888-13891 (2000)

Referenz:ki-2000-t04

Vedmedenko, E. Y., Oepen, H.-P., Ghazali, A., Lévy, J. C. S., Lévy, J. C. S., Kirschner, J.

Physical Review Letters 84, (25),pp 5884-5887 (2000)

Referenz:ki-2000-m02

Vollmer, R., van Dijken, S., Schleberger, M., Kirschner, J.

Physical Review B 61, (2),pp 1303-1310 (2000)

Referenz:ki-2000-d01

Vollmer, R., Kirschner, J.

Physical Review B 61, (6),pp 4146-4154 (2000)

Referenz:ki-2000-i02

Weber, N. B., Bethke, C., Hillebrecht, F. U.

Journal of Magnetism and Magnetic Materials 226-230, pp 1573-1576 (2000)


Wulfhekel, W., Ding, H. F., Kirschner, J.

Journal of Applied Physics 87, (9 Part 3),pp 6475-6477 (2000)

Referenz:ki-2000-h01

Wulfhekel, W., Zavaliche, F., Porrati, F., Oepen, H.-P., Kirschner, J.

Europhysics Letters 49, (5),pp 651-657 (2000)

Referenz:ki-2000-n01

Wu, Y. Z., Vollmer, R., Regensburger, J., Kirschner, J.

Physical Review B 62, (9),pp 5810-5816 (2000)

Referenz:ki-2000-i03

Zavaliche, F., Manaila, R., Haberkern, R., Häussler, P., Poon, S. J., Belu-Marian, A., Devenyi, A.

Physica Status Solidi B 218, pp 485 (2000)

Referenz:ki-2000-c01

Zavaliche, F., Wulfhekel, W., Xu, H., Kirschner, J.

Journal of Applied Physics 88, (9),pp 5289-5292 (2000)

Referenz:ki-2000-s02

Zhang, G. P., Hübner, W.

Physical Review Letters 85, (14),pp 3025-3028 (2000)

Referenz:ki-2000-l01

Zheng, M., Shen, J., Barthel, J., Ohresser, P., Mohan, C.-V., Kirschner, J.

Journal of Physics C 12,, pp 783-794 (2000)

Referenz:ki-2000-g03

Ziethen, Ch., Schmidt, O., Marx, G. K. L., Marx, G. K. L., Schönhense, G., Frömter, R., Gilles, J., Kirschner, J., Schneider, C. M., Gröning, O.

Journal of Electron Spectroscopy and Related Phenomena 107, (3),pp 261-271 (2000)

Referenz:ki-2000-o01