A straightforward approach to spin-polarized scanning tunneling microscopy based on the magnetotunnel effect between a ferromagnetic tip and a ferromagnetic sample is demonstrated. By periodically changing the magnetization of the tip in combination with a lock-in technique, topographic and spin-dependent parts of the tunnel current are separated and the topography and the magnetic structure of the sample are recorded simultaneously. Results are given for polycrystalline Ni and single crystalline Co(0001) surfaces, revealing a high spin contrast, low data acquisition times, and a resolution down to 10 nm. Potentials and limitations of this technique are discussed.