Häußler, D., Messerschmidt, U., Bartsch, M., Appel, F., Wagner, R.
In situ high-voltage electron microscope deformation study on a two-phase( a2+g) TiAl alloy
Materials Science & Engineering A 233, pp 15-25 (1997)
In situ straining experiments in a high-voltage electron microscope have been performed on
two-phase Ti-47at.%Al-2at.Cr-0.2at.%Si at room temperature and at 900 K. Two microstructures
were investigated which were produced by thermomechanical treatments: a so-called near-gamma
and a nearly lamellar microstructure. The processes controlling the motion of individual dislocations in the phase are very similar in both materials. At room temperature, ordinary dislocations and superdislocations show a jerky motion which is impeded by localized obstacles and jogs. At high temperature, the dislocations are smoothly bent or arranged in preferred orientations and move in a viscous way. This mode of motions as well as the nonplanar arrangement of dislocations point to the action of climb as an essential process during the high-temperature deformation of Ti-Al. These observations are very similar to those on Al-rich single phase TiAl investigated earlier. The considerably higher flow stress of the two-phase alloys is an effect of their particular microstructures, i.e. of grain boundaries and lamella interfaces.
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