Messerschmidt, U., Baither, D., Bartsch, M., Baufeld, B., Geyer, B., Guder, S., Wasilkowska, A., Czyrska-Filemonowicz, A., Yamaguchi, M., Feuerbacher, M., Urban, K.
High-temperature in situ straining experiments in the high-voltage electron microscope.
Microscopy and Microanalysis 3, pp 226-234 (1998)
ki-1998-h02