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Frömter, R., Oepen, H.-P., Kirschner, J.

A miniaturized detector for high-resolution SEMPA
Applied Physics A 76, (6),pp 869-871 (2003)
The basics of the scanning electron microscope with polarization analysis are briefly reviewed, emphasizing the achievable magnetic resolution and image contrast. The design of an optimized spin-polarization detector based on the well-established LEED scattering principle is presented. Results of first tests are reported.