Tusche, C., Meyerheim, H. L., Jedrecy, N., Renaud, G., Ernst, A., Henk, J., Bruno, P., Kirschner, J.
Reply to the Comment on 'Destructive effect of disorder and bias voltage on interface resonance transmission in symmetric tunnel junctions'
Physical Review Letters 96, (11),pp 119602/1 (2006)
TH-2006-14