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Kirschner, J., Kerherve, G., Winkler, C.

Reflection-time-of-flight spectrometer for two-electron (e,2e) coincidence spectroscopy on surfaces
Review of Scientific Instruments 79, (7),pp 073302/1-6 (2008)
In this article, a novel time-of-flight spectrometer for two-electron-emission (e,2e/γ,2e) correlation spectroscopy from surfaces at low electron energies is presented. The spectrometer consists of electron optics that collect emitted electrons over a solid angle of approximately 1 sr and focus them onto a multichannel plate using a reflection technique. The flight time of an electron with kinetic energy of Ekin ≅ 25 eV is around 100 ns. The corresponding time- and energy resolution are typically ≈ 1 ns and ≈ 0.65 eV, respectively. The first (e,2e) data obtained with the present setup from a LiF film are presented. 2008 American Institute of Physics