1992    
1993    
1994    
1995    
1996    
1997    
1998    
1999    
2000    
2001    
2002    
2003    
2004    
2005    
2006    
2007    
2008    
2009    
2010    
2011    
2012    
2013    
2014    
2015    
2016    
2017    
2018    
2019    
2020    
2021    
2022    
2006

Balashov, T., Takács, A. F., Wulfhekel, W., Kirschner, J.

Physical Review Letters 97, (18),pp 187201/1-4 (2006)


Bisio, F., Nyvlt, M., Franta, J., Petek, H., Kirschner, J.

Physical Review Letters 96, (8),pp 087601/1-4 (2006)


Fukumoto, K., Kuch, W., Vogel, J., Romanens, F., Pizzini, S., Camarero, J., Bonfim, M., Kirschner, J.

Physical Review Letters 96, (9),pp 097204/1-4 (2006)


Grabowski, J., Przybylski, M., Nyvlt, M., Zukrowski, J., Wulfhekel, W., Kirschner, J.

Journal of Applied Physics 99, (8),pp 08C908/1-3 (2006)


Harrison, M. J., Woodruff, D. P., Robinson, J., Sander, D., Pan, W., Kirschner, J.

Physical Review B 74, (16),pp 165402 (2006)


Huang, R. Z., Stepanyuk, V. S., Kirschner, J.

Journal of Physics: Condensed Matter 18, (17),pp L217-L223 (2006)

Referenz:TH-2006-17

Huang, R. Z., Stepanyuk, V. S., Klavsyuk, A. L., Hergert, W., Bruno, P., Kirschner, J.

Physical Review B 73, (15),pp 153404/1-4 (2006)

Referenz:TH-2006-18

Ibach, H., Etzkorn, M., Kirschner, J.

Surface and Interface Analysis 38, (12-13),pp 1615-1617 (2006)


Kuch, W., Chelaru, L. I., Offi, F., Wang, J., Kotsugi, M., Kirschner, J.

Nature Materials 5, (2),pp 128-133 (2006)


Ledig, L., Bartsch, M., Messerschmidt, U.

Materials Science & Engineering A 429, (1-2),pp 79-89 (2006)


Lee, W., Moyen, E., Wulfhekel, W., Leycuras, A., Nielsch, K., Gösele, U., Hanbücken, M.

Applied Physics A 83, (3),pp 361-363 (2006)


Longo, R. C., Stepanyuk, V. S., Kirschner, J.

Journal of Physics: Condensed Matter 18, (40),pp 9143-9149 (2006)

Referenz:TH-2006-34

Lu, Y., Przybylski, M., Nyvlt, M., Winkelmann, A., Yan, L., Shi, Y., Barthel, J., Kirschner, J.

Physical Review B 73, (3),pp 035429/1-9 (2006)


Messerschmidt, U., Bartsch, M., Dietzsch, C.

Intermetallics 14, (6),pp 607-619 (2006)


Meyerheim, H. L., Popescu, R., Kirschner, J.

Physical Review B 73, (24),pp 245432/1-8 (2006)


Meyerheim, H. L., Soyka, E., Kirschner, J.

Physical Review B 74, (8),pp 085405/1-8 (2006)


Moyen, E., Wulfhekel, W., Lee, W., Leycuras, A., Nielsch, K., Gösele, U., Hanbücken, M.

Applied Physics A 84, (4),pp 369-371 (2006)


Niebergall, L., Rodary, G., Ding, H. F., Sander, D., Stepanyuk, V. S., Bruno, P., Kirschner, J.

Physical Review B 74, (19),pp 195436/1-6 (2006)

Referenz:TH-2006-40

Przybylski, M., Yan, L., Zukrowski, J., Nyvlt, M., Shi, Y., Winkelmann, A., Barthel, J., Wasniowska, M., Kirschner, J.

Physical Review B 73, (8),pp 085413/1-9 (2006)


Schlickum, U., Gao, C. L., Wulfhekel, W., Henk, J., Bruno, P., Kirschner, J.

Physical Review B 74, (5),pp 054409/1-6 (2006)

Referenz:TH-2006-27

Schumann, F. O., Kirschner, J., Kouzakov, K. A., Berakdar, J.

AIP Conference Proceedings 811, (1),pp 197-202 AIP, Melville, USA (2006)

Referenz:TH-2006-05

Schumann, F. O., Winkler, C., Kerherve, G., Kirschner, J.

Physical Review B 73, (4),pp 041404/1-4 (2006)


Shi, Y., Zukrowski, J., Przybylski, M., Nyvlt, M., Winkelmann, A., Barthel, J., Kirschner, J.

Surface Science 600, (18),pp 4180-4184 (2006)


Tieg, C., Kuch, W., Wang, S. G., Kirschner, J.

Physical Review B 74, (9),pp 094420/1-10 (2006)


Tusche, C., Meyerheim, H. L., Hillebrecht, F. U., Kirschner, J.

Physical Review B 73, (12),pp 125401/1-6 (2006)


Tusche, C., Meyerheim, H. L., Jedrecy, N., Renaud, G., Ernst, A., Henk, J., Bruno, P., Kirschner, J.

Physical Review Letters 96, (11),pp 119602/1 (2006)

Referenz:TH-2006-14

Tusche, C., Meyerheim, H. L., Jedrecy, N., Renaud, G., Kirschner, J.

Physical Review B 74, (19),pp 195422/1-8 (2006)


Winkelmann, A., Przybylski, M., Luo, F., Shi, Y., Barthel, J.

Physical Review Letters 96, (25),pp 257205/1-4 (2006)


Wulfhekel, W. and Schlickum, U., Kirschner, J.

Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale, Magnetic Imaging of Nanostructurespp 364-368 (Eds.) Kalinin, S. V. and Gruverman, A.,Springer , New York, USA 2006


Wulfhekel, W. and Schlickum, U., Kirschner, J.

Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniquespp 121-140 (Eds.) Bhushan, B. and Fuchs, H.,Springer , Berlin, Germany , ISBN 978-3-540-26242-8 2006


Wulfhekel, W., Kirschner, J.

Encyclopedia of Materials: Science and Technology (Life-of Edition)(Eds.) Buschow, K. H. J., Cahn, R. W., Flemings, M. C., Ilschner, B., Kramer, E. J., Mahajan, S. and Veyssière, P.,Elsevier, Amsterdam, The Netherlands 2006