2006
Balashov, T., Takács, A. F., Wulfhekel, W., Kirschner, J.
Physical Review Letters 97, (18),pp 187201/1-4 (2006)
Bisio, F., Nyvlt, M., Franta, J., Petek, H., Kirschner, J.
Physical Review Letters 96, (8),pp 087601/1-4 (2006)
Fukumoto, K., Kuch, W., Vogel, J., Romanens, F., Pizzini, S., Camarero, J., Bonfim, M., Kirschner, J.
Physical Review Letters 96, (9),pp 097204/1-4 (2006)
Grabowski, J., Przybylski, M., Nyvlt, M., Zukrowski, J., Wulfhekel, W., Kirschner, J.
Journal of Applied Physics 99, (8),pp 08C908/1-3 (2006)
Harrison, M. J., Woodruff, D. P., Robinson, J., Sander, D., Pan, W., Kirschner, J.
Physical Review B 74, (16),pp 165402 (2006)
Huang, R. Z., Stepanyuk, V. S., Kirschner, J.
Journal of Physics: Condensed Matter 18, (17),pp L217-L223 (2006)
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Huang, R. Z., Stepanyuk, V. S., Klavsyuk, A. L., Hergert, W., Bruno, P., Kirschner, J.
Physical Review B 73, (15),pp 153404/1-4 (2006)
Referenz:TH-2006-18
Ibach, H., Etzkorn, M., Kirschner, J.
Surface and Interface Analysis 38, (12-13),pp 1615-1617 (2006)
Kuch, W., Chelaru, L. I., Offi, F., Wang, J., Kotsugi, M., Kirschner, J.
Nature Materials 5, (2),pp 128-133 (2006)
Ledig, L., Bartsch, M., Messerschmidt, U.
Materials Science & Engineering A 429, (1-2),pp 79-89 (2006)
Lee, W., Moyen, E., Wulfhekel, W., Leycuras, A., Nielsch, K., Gösele, U., Hanbücken, M.
Applied Physics A 83, (3),pp 361-363 (2006)
Longo, R. C., Stepanyuk, V. S., Kirschner, J.
Journal of Physics: Condensed Matter 18, (40),pp 9143-9149 (2006)
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Lu, Y., Przybylski, M., Nyvlt, M., Winkelmann, A., Yan, L., Shi, Y., Barthel, J., Kirschner, J.
Physical Review B 73, (3),pp 035429/1-9 (2006)
Messerschmidt, U., Bartsch, M., Dietzsch, C.
Intermetallics 14, (6),pp 607-619 (2006)
Meyerheim, H. L., Popescu, R., Kirschner, J.
Physical Review B 73, (24),pp 245432/1-8 (2006)
Meyerheim, H. L., Soyka, E., Kirschner, J.
Physical Review B 74, (8),pp 085405/1-8 (2006)
Moyen, E., Wulfhekel, W., Lee, W., Leycuras, A., Nielsch, K., Gösele, U., Hanbücken, M.
Applied Physics A 84, (4),pp 369-371 (2006)
Niebergall, L., Rodary, G., Ding, H. F., Sander, D., Stepanyuk, V. S., Bruno, P., Kirschner, J.
Physical Review B 74, (19),pp 195436/1-6 (2006)
Referenz:TH-2006-40
Przybylski, M., Yan, L., Zukrowski, J., Nyvlt, M., Shi, Y., Winkelmann, A., Barthel, J., Wasniowska, M., Kirschner, J.
Physical Review B 73, (8),pp 085413/1-9 (2006)
Schlickum, U., Gao, C. L., Wulfhekel, W., Henk, J., Bruno, P., Kirschner, J.
Physical Review B 74, (5),pp 054409/1-6 (2006)
Referenz:TH-2006-27
Schumann, F. O., Kirschner, J., Kouzakov, K. A., Berakdar, J.
AIP Conference Proceedings 811, (1),pp 197-202 AIP, Melville, USA (2006)
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Schumann, F. O., Winkler, C., Kerherve, G., Kirschner, J.
Physical Review B 73, (4),pp 041404/1-4 (2006)
Shi, Y., Zukrowski, J., Przybylski, M., Nyvlt, M., Winkelmann, A., Barthel, J., Kirschner, J.
Surface Science 600, (18),pp 4180-4184 (2006)
Tieg, C.
Logos Verlag Berlin, Berlin, Germany , ISBN 978-3-8325-1285-9 (2006)
Tieg, C., Kuch, W., Wang, S. G., Kirschner, J.
Physical Review B 74, (9),pp 094420/1-10 (2006)
Tusche, C., Meyerheim, H. L., Hillebrecht, F. U., Kirschner, J.
Physical Review B 73, (12),pp 125401/1-6 (2006)
Tusche, C., Meyerheim, H. L., Jedrecy, N., Renaud, G., Ernst, A., Henk, J., Bruno, P., Kirschner, J.
Physical Review Letters 96, (11),pp 119602/1 (2006)
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Tusche, C., Meyerheim, H. L., Jedrecy, N., Renaud, G., Kirschner, J.
Physical Review B 74, (19),pp 195422/1-8 (2006)
Winkelmann, A., Przybylski, M., Luo, F., Shi, Y., Barthel, J.
Physical Review Letters 96, (25),pp 257205/1-4 (2006)
Wulfhekel, W. and Schlickum, U., Kirschner, J.
Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale, Magnetic Imaging of Nanostructurespp 364-368 (Eds.) Kalinin, S. V. and Gruverman, A.,Springer , New York, USA 2006
Wulfhekel, W. and Schlickum, U., Kirschner, J.
Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniquespp 121-140 (Eds.) Bhushan, B. and Fuchs, H.,Springer , Berlin, Germany , ISBN 978-3-540-26242-8 2006
Wulfhekel, W., Kirschner, J.
Encyclopedia of Materials: Science and Technology (Life-of Edition)(Eds.) Buschow, K. H. J., Cahn, R. W., Flemings, M. C., Ilschner, B., Kramer, E. J., Mahajan, S. and Veyssière, P.,Elsevier, Amsterdam, The Netherlands 2006